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Universal Method to Determine the Dynamic NBIS- and PBS-induced Instabilities on Self-aligned Coplanar InGaZnO Thin-film Transistors
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Jang, Jun Tae | - |
| dc.contributor.author | Yu, Hye Ri | - |
| dc.contributor.author | Ahn, Geumho | - |
| dc.contributor.author | Choi, Sung-Jin | - |
| dc.contributor.author | Kim, Dong Myong | - |
| dc.contributor.author | Kim, Yong-Sung | - |
| dc.contributor.author | Oh, Saeroonter | - |
| dc.contributor.author | Baeck, Ju Heyuck | - |
| dc.contributor.author | Bae, Jong Uk | - |
| dc.contributor.author | Park, Kwon-Shik | - |
| dc.contributor.author | Yoon, Soo Young | - |
| dc.contributor.author | Kang, In Byeong | - |
| dc.contributor.author | Kim, Dae Hwan | - |
| dc.date.accessioned | 2024-06-13T03:00:30Z | - |
| dc.date.available | 2024-06-13T03:00:30Z | - |
| dc.date.issued | 2018-05 | - |
| dc.identifier.issn | 0097-966X | - |
| dc.identifier.issn | 2168-0159 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/119430 | - |
| dc.description.abstract | The method for dynamically calculating the NBIS- and PBS- induced ΔVT's is proposed based on experimentally extracted density-of-states and is demonstrated in top-gate self-aligned coplanar amorphous InGaZnO thin-film transistors. The effect of illuminance as well as the bias-dependence is successfully taken into account. Proposed method is potentially useful for the instability-aware design of OLED display backplanes. © 2018 SID. | - |
| dc.format.extent | 4 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | John Wiley and Sons Inc | - |
| dc.title | Universal Method to Determine the Dynamic NBIS- and PBS-induced Instabilities on Self-aligned Coplanar InGaZnO Thin-film Transistors | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1002/SDTP.12538 | - |
| dc.identifier.scopusid | 2-s2.0-85085262500 | - |
| dc.identifier.bibliographicCitation | Digest of Technical Papers - SID International Symposium, v.49, no.1, pp 232 - 235 | - |
| dc.citation.title | Digest of Technical Papers - SID International Symposium | - |
| dc.citation.volume | 49 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 232 | - |
| dc.citation.endPage | 235 | - |
| dc.type.docType | Conference paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordAuthor | amorphous InGaZnO thin-film transistors | - |
| dc.subject.keywordAuthor | dynamic NBIS- and PBS-induced instabilities | - |
| dc.subject.keywordAuthor | top-gate self-aligned coplanar structure | - |
| dc.identifier.url | https://sid.onlinelibrary.wiley.com/doi/abs/10.1002%2FSDTP.12538 | - |
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- OH, SAE ROON TER
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)