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Automatic test case generation of automotive smart key system using genetic algorithm

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dc.contributor.author임동진-
dc.date.accessioned2024-08-12T11:30:35Z-
dc.date.available2024-08-12T11:30:35Z-
dc.date.issued2015-05-22-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/120268-
dc.titleAutomatic test case generation of automotive smart key system using genetic algorithm-
dc.typeConference-
dc.citation.titleProceedings of 2015 JSAE Annual Congress-
dc.citation.startPage1-
dc.citation.endPage5-
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 2. Conference Papers

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