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Proposal of Deep Learning Systems Testing Framework Using Generative Large Language Models

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dc.contributor.authorLee,Joonwoo-
dc.contributor.authorJu,Hansae-
dc.contributor.authorLee,Scott Uk-Jin-
dc.date.accessioned2024-11-07T08:00:22Z-
dc.date.available2024-11-07T08:00:22Z-
dc.date.issued2024-07-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/120784-
dc.description.abstractEnsuring the robustness and reliability of deep learning systems is essential as they are used in critical applications like autonomous driving, medical diagnostics, and financial forecasting. Traditional testing methods often miss rare or adversarial scenarios that can cause failures. This proposal leverages generative large language models (LLMs), such as GPT-4, to generate adversarial inputs for testing deep learning systems. LLMs can produce diverse and contextually relevant inputs, enhancing the detection of vulnerabilities and improving the robustness of these models. The research aims to develop an LLM-based adversarial input generation framework, evaluate its effectiveness, compare it with traditional methods, and assess improvements in system robustness. This approach promises to advance AI robustness testing and ensure deep learning systems are more resilient in real-world applications.-
dc.format.extent2-
dc.language영어-
dc.language.isoENG-
dc.publisher한국컴퓨터정보학회-
dc.titleProposal of Deep Learning Systems Testing Framework Using Generative Large Language Models-
dc.title.alternative생성형 대형 언어 모델을 사용한 딥러닝 시스템 테스트 프레임워크 제안-
dc.typeArticle-
dc.publisher.location대한민국-
dc.identifier.bibliographicCitation2024년도 한국컴퓨터정보학회 하계학술대회 논문집, v.32, no.2, pp 55 - 56-
dc.citation.title2024년도 한국컴퓨터정보학회 하계학술대회 논문집-
dc.citation.volume32-
dc.citation.number2-
dc.citation.startPage55-
dc.citation.endPage56-
dc.type.docTypeProceeding-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassother-
dc.subject.keywordAuthor대형 언어 모델(Large Language Model)-
dc.subject.keywordAuthor적대적 예제 생성-
dc.subject.keywordAuthor(Adversarial Input Generation)-
dc.subject.keywordAuthor딥러닝 테스팅 (Deep Learning Testing)-
dc.identifier.urlhttps://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE11925992-
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Lee, Scott Uk Jin
ERICA 소프트웨어융합대학 (ERICA 컴퓨터학부)
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