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DDR4 DIMM의 고온 동작 실험에 따른 I/O 마진의 변화
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백상현 | - |
| dc.date.accessioned | 2025-04-01T07:01:47Z | - |
| dc.date.available | 2025-04-01T07:01:47Z | - |
| dc.date.issued | 2019-06 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/122758 | - |
| dc.language | 한국어 | - |
| dc.language.iso | KOR | - |
| dc.title | DDR4 DIMM의 고온 동작 실험에 따른 I/O 마진의 변화 | - |
| dc.type | Conference | - |
| dc.citation.title | 2019 Korea Test Conference | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 3 | - |
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)