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DDR4 SDRA에서 DQS에 따른 I/O 마진 값의 변화

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dc.contributor.author백상현-
dc.date.accessioned2025-04-01T07:01:49Z-
dc.date.available2025-04-01T07:01:49Z-
dc.date.issued2017-06-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/122761-
dc.language한국어-
dc.language.isoKOR-
dc.titleDDR4 SDRA에서 DQS에 따른 I/O 마진 값의 변화-
dc.typeConference-
dc.citation.title2017 Korea Test Conference-
dc.citation.startPage1-
dc.citation.endPage3-
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 2. Conference Papers

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ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
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