Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

A Case Study of JTAG Interface Connection Failure in FPGA System Caused by SMT Defect

Full metadata record
DC Field Value Language
dc.contributor.author백상현-
dc.date.accessioned2025-04-01T07:01:53Z-
dc.date.available2025-04-01T07:01:53Z-
dc.date.issued2014-06-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/122768-
dc.description.abstractA FPGA is broadly used because of its high flexibility and high performance. This paper describes the diagnosis procedure when the FPGA system cannot connect with JTAG Interface; i) the JTAG Programmer and related circuit on the system, ii) the PFGA Configuration circuit, iii) the power status for the FPGA. iv) the SMT defect with the PCB and the FPGA, v) the bug and defect of FPGA Software or the FPGA chip. With this procedure the author succeeded to find out the SMT defect was the cause of the connection failure.-
dc.language영어-
dc.language.isoENG-
dc.titleA Case Study of JTAG Interface Connection Failure in FPGA System Caused by SMT Defect-
dc.typeConference-
dc.citation.title2014 Korea Test Conference-
dc.citation.startPage222-
dc.citation.endPage225-
Files in This Item
There are no files associated with this item.
Appears in
Collections
COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 2. Conference Papers

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Baeg, Sanghyeon photo

Baeg, Sanghyeon
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE