Substitutive model of the sense amplifier dynamic 2-cell incorrect read fault of type 1

Abstract

Faults in a sense amplifier can be modeled by dynamic two-cell functional fault models (FFMs) as seen in [1]. As introduced in [1], they can be detected by special march test called ‘March iC-’, which have a particular addressing order and the same form of the March C- elements. However, it is really hard to know the specific memory address information and data scrambling since it is confidential, that means it is also hard to make special data addressing pattern. This makes it hard to generate March iC- test, so it is impossible to detect dynamic two-cell FFMs by using this test unless you know the information of the memory. However, since they did not mention why fault did not occur even though they gave operations in a same cell, we will perform read operations with opposite data in a same cell in order to show that dynamic two-cell incorrect read fault of type1(d2cIRF1) in [1] can be replaced by dynamic single-cell FFMs[2]. We will verify this by using Hspice simulation. By substituting d2cIRF1, we don’t need to conduct March iC- test which is required to have information of the memory in order to detect fault, and general march tests[3-4] will show the high fault coverage(FC) of the substitutive FFMs.