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SoC 테스트 비용 절감을 위한 다중 테스트기술
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주 | - |
| dc.date.accessioned | 2025-04-01T09:01:46Z | - |
| dc.date.available | 2025-04-01T09:01:46Z | - |
| dc.date.issued | 2008-02 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/123093 | - |
| dc.description.abstract | SoC 테스트 비용 절감기술 | - |
| dc.language | 한국어 | - |
| dc.language.iso | KOR | - |
| dc.title | SoC 테스트 비용 절감을 위한 다중 테스트기술 | - |
| dc.type | Conference | - |
| dc.citation.title | 2008년 IT-컨버전스 합동학술대회 | - |
| dc.citation.conferencePlace | 대한민국 | - |
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