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Redundancy TSV와 래퍼셀을 활용한 효율적인 TSV 병렬 테스트 구조 설계
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주 | - |
| dc.date.accessioned | 2025-04-01T09:01:53Z | - |
| dc.date.available | 2025-04-01T09:01:53Z | - |
| dc.date.issued | 2011-06 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/123105 | - |
| dc.language | 한국어 | - |
| dc.language.iso | KOR | - |
| dc.title | Redundancy TSV와 래퍼셀을 활용한 효율적인 TSV 병렬 테스트 구조 설계 | - |
| dc.type | Conference | - |
| dc.citation.title | 한국반도체테스트학술대회 | - |
| dc.citation.conferencePlace | 대한민국 | - |
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