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Acoustic Emission Monitoring for AFM Nano Scratching
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이성환 | - |
| dc.date.accessioned | 2025-04-01T09:32:04Z | - |
| dc.date.available | 2025-04-01T09:32:04Z | - |
| dc.date.issued | 2009-06 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/123205 | - |
| dc.title | Acoustic Emission Monitoring for AFM Nano Scratching | - |
| dc.type | Conference | - |
| dc.citation.title | ICMDT 2009 | - |
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Related Researcher
- Lee, Seoung Hwan
- ERICA 공학대학 (DEPARTMENT OF MECHANICAL ENGINEERING)