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Variant Approaches of Anti-Pattern Detection on Design & Code Level - A Literature Review
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Scott Uk-Jin Lee | - |
| dc.date.accessioned | 2025-04-09T02:02:43Z | - |
| dc.date.available | 2025-04-09T02:02:43Z | - |
| dc.date.issued | 2018-08 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/124509 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.title | Variant Approaches of Anti-Pattern Detection on Design & Code Level - A Literature Review | - |
| dc.type | Conference | - |
| dc.citation.title | The 3rd International Conference on Computing Convergence and Applications | - |
| dc.citation.startPage | 117 | - |
| dc.citation.endPage | 120 | - |
| dc.citation.conferencePlace | 대한민국 | - |
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Related Researcher
- Lee, Scott Uk Jin
- ERICA 소프트웨어융합대학 (ERICA 컴퓨터학부)