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A Probabilistic Diagnose Model of Product Defect by Partially Shuffled Equipment Data
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 허선 | - |
| dc.date.accessioned | 2025-04-09T03:02:20Z | - |
| dc.date.available | 2025-04-09T03:02:20Z | - |
| dc.date.issued | 2019-11-23 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/124862 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.title | A Probabilistic Diagnose Model of Product Defect by Partially Shuffled Equipment Data | - |
| dc.type | Conference | - |
| dc.citation.title | EAWIE 2019 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 24 | - |
| dc.citation.conferenceName | The 6th East Asia Workshop on Industrial Engineering(EAWIE 2019) | - |
| dc.citation.conferencePlace | 대만 | - |
| dc.citation.conferencePlace | Taipei, Taiwan | - |
| dc.citation.conferenceDate | 2019-11-20 ~ 2019-11-23 | - |
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