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Dose Measurements and Effects in DRAMs During PCB Inspections Using X-rays
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백상현 | - |
| dc.date.accessioned | 2025-04-16T00:30:29Z | - |
| dc.date.available | 2025-04-16T00:30:29Z | - |
| dc.date.issued | 2024-07 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/125071 | - |
| dc.description.abstract | Under the PCB inspection environment, TID levels were measured for various combinations of filters, PCB, and packages to demonstrate significant variances in TID effects by X-rays. Retention-time degradations were compared for 1y-nm DRAM components. | - |
| dc.format.extent | 4 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | NSREC - IEEE Nuclear & Space Radiation Effects Conference | - |
| dc.title | Dose Measurements and Effects in DRAMs During PCB Inspections Using X-rays | - |
| dc.type | Article | - |
| dc.identifier.bibliographicCitation | NSREC - IEEE Nuclear & Space Radiation Effects Conference, pp 1 - 4 | - |
| dc.citation.title | NSREC - IEEE Nuclear & Space Radiation Effects Conference | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 4 | - |
| dc.type.docType | Proceeding | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | foreign | - |
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)