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Voltage Dependence of Single Event Error Rates for Flip-Flops in Advanced Technologies - from Nominal to Near Threshold
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백상현 | - |
| dc.date.accessioned | 2021-06-22T18:48:00Z | - |
| dc.date.available | 2021-06-22T18:48:00Z | - |
| dc.date.issued | 2014-05-20 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/16744 | - |
| dc.title | Voltage Dependence of Single Event Error Rates for Flip-Flops in Advanced Technologies - from Nominal to Near Threshold | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Single Event Effects(SEE) Symposium and Military and Aerospace Programmable Logic Devices(MAPLD) Workshop | - |
| dc.citation.conferencePlace | San Diego, Marriott La Jolla | - |
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)