A Graphical Model to Diagnose Product Defects with Partially Shuffled Equipment Data
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ahn, Gilseung | - |
dc.contributor.author | Hur, Sun | - |
dc.contributor.author | Shin, Dongmin | - |
dc.contributor.author | Park, You-Jin | - |
dc.date.accessioned | 2021-06-22T09:25:11Z | - |
dc.date.available | 2021-06-22T09:25:11Z | - |
dc.date.issued | 2019-12 | - |
dc.identifier.issn | 2227-9717 | - |
dc.identifier.issn | 2227-9717 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/2013 | - |
dc.description.abstract | The diagnosis of product defects is an important task in manufacturing, and machine learning-based approaches have attracted interest from both the industry and academia. A high-quality dataset is necessary to develop a machine learning model, but the manufacturing industry faces several data-collection issues including partially shuffled data, which arises when a product ID is not perfectly inferred and yields an unstable machine learning model. This paper introduces latent variables to formulate a supervised learning model that addresses the problem of partially shuffled data. The experimental results show that our graphical model deals with the shuffling of product order and can detect a defective product far more effectively than a model that ignores shuffling. | - |
dc.format.extent | 13 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | MDPI | - |
dc.title | A Graphical Model to Diagnose Product Defects with Partially Shuffled Equipment Data | - |
dc.type | Article | - |
dc.publisher.location | 스위스 | - |
dc.identifier.doi | 10.3390/pr7120934 | - |
dc.identifier.scopusid | 2-s2.0-85079619338 | - |
dc.identifier.wosid | 000506635300071 | - |
dc.identifier.bibliographicCitation | PROCESSES, v.7, no.12, pp 1 - 13 | - |
dc.citation.title | PROCESSES | - |
dc.citation.volume | 7 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 13 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Engineering, Chemical | - |
dc.subject.keywordPlus | FAULT-DIAGNOSIS | - |
dc.subject.keywordAuthor | partially shuffled time series | - |
dc.subject.keywordAuthor | graphical model | - |
dc.subject.keywordAuthor | equipment data analysis | - |
dc.subject.keywordAuthor | defect diagnosis | - |
dc.subject.keywordAuthor | multi-source data fusion | - |
dc.identifier.url | https://www.proquest.com/docview/2550237217?accountid=11283 | - |
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