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Efficient diagnosis technique for aging defects on automotive semiconductor chips

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dc.contributor.authorJung, Jihun-
dc.contributor.authorAnsari, M.A.-
dc.contributor.authorKim, Dooyoung-
dc.contributor.authorYi, Hyunbean-
dc.contributor.authorPark, Sungju-
dc.date.accessioned2021-06-22T21:42:27Z-
dc.date.available2021-06-22T21:42:27Z-
dc.date.issued2015-05-
dc.identifier.issn1530-1877-
dc.identifier.issn1558-1780-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/20578-
dc.description.abstractThe semiconductor aging is one of the serious threats for the reliability of the system. This paper presents an efficient mechanism for predicting the aging effect. The captured data will be unloaded by shift operation, then verified through the aging monitoring operation. Especially the aging level of automotive semiconductor devices can be estimated by controlling the capture timing. Since the aging monitoring function is efficiently on and off during normal operation, power consumption can be reduced significantly compared with other approaches. © 2015 IEEE.-
dc.format.extent2-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleEfficient diagnosis technique for aging defects on automotive semiconductor chips-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/ETS.2015.7138767-
dc.identifier.scopusid2-s2.0-84942543800-
dc.identifier.wosid000380572100041-
dc.identifier.bibliographicCitationProceedings - 2015 20th IEEE European Test Symposium, ETS 2014, pp 1 - 2-
dc.citation.titleProceedings - 2015 20th IEEE European Test Symposium, ETS 2014-
dc.citation.startPage1-
dc.citation.endPage2-
dc.type.docTypeConference Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusFlip flop circuits-
dc.subject.keywordPlusAging defects-
dc.subject.keywordPlusAging monitoring-
dc.subject.keywordPlusAutomotive semiconductors-
dc.subject.keywordPlusDiagnosis techniques-
dc.subject.keywordPlusNormal operations-
dc.subject.keywordPlusOn-line tests-
dc.subject.keywordPlusScan flip-flops-
dc.subject.keywordPlusShift operations-
dc.subject.keywordPlusSemiconductor devices-
dc.subject.keywordAuthoraging monitoring-
dc.subject.keywordAuthoron-line test-
dc.subject.keywordAuthorscan flip-flop-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7138767-
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