Novel Error Detection Scheme With the Harmonious Use of Parity Codes, Well-Taps, and Interleaving Distance
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jeon, Sang Hoon | - |
dc.contributor.author | Lee, Soonyoung | - |
dc.contributor.author | Baeg, Sanghyeon | - |
dc.contributor.author | Kim, Ilgon | - |
dc.contributor.author | Kim, Gunrae | - |
dc.date.accessioned | 2021-06-22T22:25:14Z | - |
dc.date.available | 2021-06-22T22:25:14Z | - |
dc.date.created | 2021-01-21 | - |
dc.date.issued | 2014-10 | - |
dc.identifier.issn | 0018-9499 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/21588 | - |
dc.description.abstract | This paper explores the effectiveness of error detection schemes in increasingly multiple-cell upset-dominant technologies, specifically SRAM. A review of interleaving distance, parity codes, and well-taps is conducted to examine each attribute. Then, the paper proposes a novel error detection scheme with the harmonious use of the multiple-cell upset inhibition effects of well-taps, the detectability of parity codes, and an interleaving distance scheme to create an effective error detection scheme that is both flexible and has a high implementation prospect. A row depth model is created to assess the effectiveness of the proposed scheme. The model shows that advanced technologies with greater multiple-cell upset sizes and ratios will experience error detection failures with schemes such as single error correction-double error detection, whereas the proposed scheme remains effective. Experimental data supports the premise that well-taps inhibit multiple-cell upset, as it is found that 1% cross well-taps. The proposed scheme is recognized to be at least three times better against error detection failures than single error correction-double error detection. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Novel Error Detection Scheme With the Harmonious Use of Parity Codes, Well-Taps, and Interleaving Distance | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Baeg, Sanghyeon | - |
dc.identifier.doi | 10.1109/TNS.2014.2349504 | - |
dc.identifier.scopusid | 2-s2.0-84907974832 | - |
dc.identifier.wosid | 000343980900026 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.61, no.5, pp.2711 - 2717 | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | - |
dc.citation.title | IEEE TRANSACTIONS ON NUCLEAR SCIENCE | - |
dc.citation.volume | 61 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 2711 | - |
dc.citation.endPage | 2717 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Nuclear Science & Technology | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nuclear Science & Technology | - |
dc.subject.keywordPlus | NM | - |
dc.subject.keywordPlus | UPSETS | - |
dc.subject.keywordPlus | CHALLENGES | - |
dc.subject.keywordPlus | SELECTION | - |
dc.subject.keywordPlus | SRAMS | - |
dc.subject.keywordAuthor | Effective interleaving distance | - |
dc.subject.keywordAuthor | error correction code | - |
dc.subject.keywordAuthor | interleaving distance | - |
dc.subject.keywordAuthor | multiple-bit upset | - |
dc.subject.keywordAuthor | multiple-cell upset | - |
dc.subject.keywordAuthor | parity code | - |
dc.subject.keywordAuthor | row depth | - |
dc.subject.keywordAuthor | single error correction-double error detection | - |
dc.subject.keywordAuthor | single-event effect | - |
dc.subject.keywordAuthor | well-tap | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/6909089 | - |
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