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IEEE 1149.7 인터페이스를 이용한 차량용 칩 고장 진단 기술
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주 | - |
| dc.date.accessioned | 2021-06-22T23:23:59Z | - |
| dc.date.available | 2021-06-22T23:23:59Z | - |
| dc.date.created | 2021-02-18 | - |
| dc.date.issued | 2014-05 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/22866 | - |
| dc.language | 한국어 | - |
| dc.language.iso | ko | - |
| dc.publisher | 대한전자공학회 | - |
| dc.title | IEEE 1149.7 인터페이스를 이용한 차량용 칩 고장 진단 기술 | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | 박성주 | - |
| dc.identifier.bibliographicCitation | 대한전자공학회 SoC 학술대회, pp.1 - 2 | - |
| dc.relation.isPartOf | 대한전자공학회 SoC 학술대회 | - |
| dc.citation.title | 대한전자공학회 SoC 학술대회 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 2 | - |
| dc.type.rims | ART | - |
| dc.description.journalClass | 3 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | other | - |
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