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New DRAM HCI Qualification Method Emphasizing on Repeated Memory Access
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 백상현 | - |
| dc.date.accessioned | 2021-06-22T23:27:38Z | - |
| dc.date.available | 2021-06-22T23:27:38Z | - |
| dc.date.issued | 2010-10-20 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/22971 | - |
| dc.title | New DRAM HCI Qualification Method Emphasizing on Repeated Memory Access | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | IEEE International Integrated Reliability Workshop | - |
| dc.citation.conferencePlace | Stanford Sierra Conference Center, CA., USA | - |
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)