Reliability issues for automobile SoCs
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, S. | - |
dc.date.accessioned | 2021-06-23T01:42:28Z | - |
dc.date.available | 2021-06-23T01:42:28Z | - |
dc.date.issued | 2014-01 | - |
dc.identifier.issn | 0000-0000 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/25837 | - |
dc.description.abstract | Current vehicles are built with complex electronic systems embedded with more than a hundred microprocessors through complicated automotive networks. In the de facto ISO 26262 standard in the automotive industry, Automotive Safety Integrity Level (ASIL) is classified into four different levels. In this chapter, the ISO 26262 hardware ASIL is described in detail. Then, we introduce fault diagnosis architectures that use various design for testability techniques such as scan design, built-in self-test, IEEE boundary scan design, and error correcting codes for increasing hardware reliability. © Springer Science+Business Media Dordrecht 2014. | - |
dc.format.extent | 28 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Springer Netherlands | - |
dc.title | Reliability issues for automobile SoCs | - |
dc.type | Article | - |
dc.publisher.location | 네델란드 | - |
dc.identifier.doi | 10.1007/978-94-017-9075-8_10 | - |
dc.identifier.scopusid | 2-s2.0-84956774684 | - |
dc.identifier.bibliographicCitation | Algorithm and Soc Design for Automotive Vision Systems: For Smart Safe Driving System, pp 263 - 290 | - |
dc.citation.title | Algorithm and Soc Design for Automotive Vision Systems: For Smart Safe Driving System | - |
dc.citation.startPage | 263 | - |
dc.citation.endPage | 290 | - |
dc.type.docType | Book Chapter | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | Accident prevention | - |
dc.subject.keywordPlus | Automotive industry | - |
dc.subject.keywordPlus | Built-in self test | - |
dc.subject.keywordPlus | Complex networks | - |
dc.subject.keywordPlus | Design for testability | - |
dc.subject.keywordPlus | Embedded systems | - |
dc.subject.keywordPlus | Hardware | - |
dc.subject.keywordPlus | Automotive networks | - |
dc.subject.keywordPlus | Automotive safety integrity levels | - |
dc.subject.keywordPlus | Boundary scan design | - |
dc.subject.keywordPlus | Complex electronic systems | - |
dc.subject.keywordPlus | Error correcting code | - |
dc.subject.keywordPlus | Hardware reliability | - |
dc.subject.keywordPlus | ISO 26262 | - |
dc.subject.keywordPlus | Scan designs | - |
dc.subject.keywordPlus | Automobile electronic equipment | - |
dc.identifier.url | https://link.springer.com/chapter/10.1007/978-94-017-9075-8_10 | - |
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