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Strain evaluation of InN layer grown on AlN/Si(111)

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dc.contributor.author오재응-
dc.date.accessioned2021-06-23T01:49:21Z-
dc.date.available2021-06-23T01:49:21Z-
dc.date.created2020-12-17-
dc.date.issued2008-08-04-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/26026-
dc.description.abstractInN has promising properties such as a small effective mass, a high electron drift velocity, and small band gap energy, which make it useful in a variety of high speed devices, high efficiency solar cells, and infrared light sources [1]. However, InN remains a mysterious material, especoally with regard to crystal growth.-
dc.publisherDepartment of Physics and Astronomy-
dc.titleStrain evaluation of InN layer grown on AlN/Si(111)-
dc.typeConference-
dc.contributor.affiliatedAuthor오재응-
dc.identifier.bibliographicCitationThe 15th International Conference on Molecular Beam Epitaxy-
dc.relation.isPartOfThe 15th International Conference on Molecular Beam Epitaxy-
dc.citation.titleThe 15th International Conference on Molecular Beam Epitaxy-
dc.citation.conferencePlaceVANCOUVER, CANADA-
dc.type.rimsCONF-
dc.description.journalClass1-
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 2. Conference Papers

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