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CAN 프로토콜을 이용한 칩 고장 진단 기술 개발
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 황도연 | - |
| dc.contributor.author | 김두영 | - |
| dc.contributor.author | 문창민 | - |
| dc.contributor.author | 박성주 | - |
| dc.date.accessioned | 2021-06-23T02:04:59Z | - |
| dc.date.available | 2021-06-23T02:04:59Z | - |
| dc.date.issued | 2013-11 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/26345 | - |
| dc.description.abstract | Current automobiles are equipped with a large number of ECUs. Thus the reliability of each electronic component becomes extremely important. To build highly reliable automobiles, effective automobile diagnosis technique necessarily have to be developed. In this paper, automobile hardware diagnosis technique using CAN network is proposed. This technique will ensure significantly reliability as well as exact defect diagnosis. | - |
| dc.format.extent | 4 | - |
| dc.language | 한국어 | - |
| dc.language.iso | KOR | - |
| dc.publisher | 대한전자공학회 | - |
| dc.title | CAN 프로토콜을 이용한 칩 고장 진단 기술 개발 | - |
| dc.title.alternative | Development of automobile hardware diagnosis technique using CAN protocol | - |
| dc.type | Article | - |
| dc.publisher.location | 대한민국 | - |
| dc.identifier.bibliographicCitation | 2013년 대한전자공학회 추계학술대회 논문집, pp 655 - 658 | - |
| dc.citation.title | 2013년 대한전자공학회 추계학술대회 논문집 | - |
| dc.citation.startPage | 655 | - |
| dc.citation.endPage | 658 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | other | - |
| dc.identifier.url | https://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE02341514 | - |
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