Quality and Reliability Evaluation for Nano-Scaled Devices
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 강창욱 | - |
dc.date.accessioned | 2021-06-23T03:47:48Z | - |
dc.date.available | 2021-06-23T03:47:48Z | - |
dc.date.created | 2020-12-17 | - |
dc.date.issued | 2006-06-21 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/28551 | - |
dc.description.abstract | In the next decade, reliability will be a key issue in nanofabrication due to the complex engineering and design of products along with the turbulent environment of change going on in nano-science. This research introduces adaptation of advanced statistical analysis toward nano-scaled display devices. This research will also catalyze further statistical modeling in nanofabrication outside of reliability. While currently there is little research on nano-science mentioned in the mainstream statistical literature, there is potential growth for design of experiments, robust estimation and statistical prediction within this framework. | - |
dc.publisher | IEEE Engineering Management Society | - |
dc.title | Quality and Reliability Evaluation for Nano-Scaled Devices | - |
dc.type | Conference | - |
dc.contributor.affiliatedAuthor | 강창욱 | - |
dc.identifier.bibliographicCitation | ICMIT 2006 International Conference on Management of Innovation and Technology | - |
dc.relation.isPartOf | ICMIT 2006 International Conference on Management of Innovation and Technology | - |
dc.citation.title | ICMIT 2006 International Conference on Management of Innovation and Technology | - |
dc.citation.conferencePlace | Singapore | - |
dc.type.rims | CONF | - |
dc.description.journalClass | 1 | - |
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