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Polarization errors associated with reflective objectives in a micro-spot spectroscopic ellipsometer

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dc.contributor.authorPark, Sungmo-
dc.contributor.authorAn, Ilsin-
dc.date.accessioned2021-06-22T10:02:57Z-
dc.date.available2021-06-22T10:02:57Z-
dc.date.created2021-01-21-
dc.date.issued2019-05-
dc.identifier.issn0021-4922-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/2952-
dc.description.abstractA micro-spot spectroscopic ellipsometer covering 1.5-4.8 eV is developed using two infinity-corrected reflective objectives. Only a small portion of the entrance pupil in the objective is used to obtain a similar to 50 mu m x 70 mu m spot on a sample. However, non-normal reflections inside the objectives cause experimental errors (up to 2.3 degrees in Delta) when they are arranged symmetrically about a sample. In this paper, we show how to diagnose the polarization errors associated with the reflective objectives and how to deal with them. (C) 2019 The Japan Society of Applied Physics-
dc.language영어-
dc.language.isoen-
dc.publisherIOP PUBLISHING LTD-
dc.titlePolarization errors associated with reflective objectives in a micro-spot spectroscopic ellipsometer-
dc.typeArticle-
dc.contributor.affiliatedAuthorAn, Ilsin-
dc.identifier.doi10.7567/1347-4065/ab1646-
dc.identifier.scopusid2-s2.0-85067800292-
dc.identifier.wosid000466804600001-
dc.identifier.bibliographicCitationJAPANESE JOURNAL OF APPLIED PHYSICS, v.58, no.5-
dc.relation.isPartOfJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.citation.titleJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.citation.volume58-
dc.citation.number5-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.identifier.urlhttps://iopscience.iop.org/article/10.7567/1347-4065/ab1646-
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