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TEM을 이용한 50nm 표준입자크기의 측정
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 안강호 | - |
| dc.date.accessioned | 2021-06-23T05:11:40Z | - |
| dc.date.available | 2021-06-23T05:11:40Z | - |
| dc.date.created | 2020-12-17 | - |
| dc.date.issued | 2004-07-06 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/30389 | - |
| dc.publisher | KAPAR | - |
| dc.title | TEM을 이용한 50nm 표준입자크기의 측정 | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 안강호 | - |
| dc.identifier.bibliographicCitation | 5th Korean conference on Aerosol and Particle Tech. | - |
| dc.relation.isPartOf | 5th Korean conference on Aerosol and Particle Tech. | - |
| dc.citation.title | 5th Korean conference on Aerosol and Particle Tech. | - |
| dc.citation.conferencePlace | 용평 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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