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3D image quality index using SDP-based binocular perception model

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dc.contributor.authorKo, Hyunsuk-
dc.contributor.authorKim, Chang-Su-
dc.contributor.authorChoi, Seo Young-
dc.contributor.authorKuo, C. -C. Jay-
dc.date.accessioned2021-06-23T05:42:53Z-
dc.date.available2021-06-23T05:42:53Z-
dc.date.created2021-01-21-
dc.date.issued2013-06-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/30926-
dc.description.abstractA novel quality index for stereoscopic image pairs is proposed in this work. First, we introduce a parameter called the structural distortion parameter (SDP), which varies according to different distortion types. Then, we use the SDP as a control parameter in a binocular perception model, and apply it into three components of SSIM to obtain an overall quality index. In the proposed framework, the binocular model accommodates distortion types and distortion degrees and, therefore, offers robust quality assessment results for both symmetric and asymmetric distortions. It is shown by experimental results that the proposed index outperforms several existing 3D image quality index methods.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-
dc.title3D image quality index using SDP-based binocular perception model-
dc.typeArticle-
dc.contributor.affiliatedAuthorKo, Hyunsuk-
dc.identifier.doi10.1109/IVMSPW.2013.6611936-
dc.identifier.scopusid2-s2.0-84888150856-
dc.identifier.wosid000335308100047-
dc.identifier.bibliographicCitation2013 IEEE 11th IVMSP Workshop: 3D Image/Video Technologies and Applications, IVMSP 2013 (IVMSP 2013), pp.1 - 4-
dc.relation.isPartOf2013 IEEE 11th IVMSP Workshop: 3D Image/Video Technologies and Applications, IVMSP 2013 (IVMSP 2013)-
dc.citation.title2013 IEEE 11th IVMSP Workshop: 3D Image/Video Technologies and Applications, IVMSP 2013 (IVMSP 2013)-
dc.citation.startPage1-
dc.citation.endPage4-
dc.type.rimsART-
dc.type.docTypeProceedings Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaImaging Science & Photographic Technology-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryImaging Science & Photographic Technology-
dc.subject.keywordPlusINPUTS-
dc.subject.keywordAuthor3D-
dc.subject.keywordAuthorquality index-
dc.subject.keywordAuthorasymmetric distortion-
dc.subject.keywordAuthorbinocular perception model-
dc.subject.keywordAuthorstructural distortion-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/6611936-
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ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
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