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Development of a New Analysis Algorithm Based on the Wavelet Transforms for Noisy Langmuir-Probe Traces
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김대경 | - |
| dc.date.accessioned | 2021-06-23T07:22:39Z | - |
| dc.date.available | 2021-06-23T07:22:39Z | - |
| dc.date.issued | 2001-06-21 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/32731 | - |
| dc.title | Development of a New Analysis Algorithm Based on the Wavelet Transforms for Noisy Langmuir-Probe Traces | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | The 28th IEEE International Conference on Plasma | - |
| dc.citation.conferencePlace | Las Vegas, Nevada USA | - |
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- Kim, Dai-Gyoung
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