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A Probabilistic Diagnose Model of Product Defect by Partially Shuffled Equipment Data
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 신동민 | - |
| dc.date.accessioned | 2021-06-22T10:06:10Z | - |
| dc.date.available | 2021-06-22T10:06:10Z | - |
| dc.date.issued | 2019-11-22 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/3306 | - |
| dc.title | A Probabilistic Diagnose Model of Product Defect by Partially Shuffled Equipment Data | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | EAWIE 2019 | - |
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Related Researcher
- Shin, Dong min
- ERICA 공학대학 (DEPARTMENT OF INDUSTRIAL & MANAGEMENT ENGINEERING)