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1. Journal Articles(COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF APPLIED PHYSICS > 1. Journal Articles)776

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Collection's Items (Sorted by Issue Date in Descending order): 661 to 680 of 776

SCISCOPUSKCI
Defect characterization of Ru/Mo/Si EUV reflector by optical modelingGo to Link

Kang, In-Yong; Chung, Yong-Chae; Oh, Hye-Keun; Ahn, Jinho

ArticleIssue Date2005CitationJournal of the Korean Physical Society, v.47, pp S373 - S376Publisher한국물리학회
SCIESCOPUS
Safety diagnosis of collided subway electric multiple units (EMUs)Go to Link

Chung, Jong Duk; Kim, Jeong Guk; Bae, Dae Sung

ArticleIssue Date2005CitationKey Engineering Materials, v.297-300, pp 1876 - 1881PublisherTrans Tech Publications Ltd.
SCIESCOPUS
Dynamic orientation effects on electron-impact excitations in kappa-Maxwellian plasmasGo to Link

Kim, Chang-Geun; Jung, Young-Dae

ArticleIssue Date2005CitationJOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, v.38, no.21, pp.3867 - 3874PublisherIOP PUBLISHING LTD
SCIESCOPUS
Rubbed polyimide layers studied by rotating sample and compensator spectroscopic ellipsometryGo to Link

Kyoung, Jaesun; Bang, Kyungyoon; Oh, Hyekeun.; Lee, Iksoo; Kim, Hochul; Jeon, Dong Ryul; An, Ilsin

ArticleIssue Date2005CitationJapanese Journal of Applied Physics, v.44, no.10, pp 7667 - 7670PublisherIOP Publishing Ltd
SCOPUS
Aerial image characteristics of modified absorber model for extreme ultraviolet lithography (EUVL)

Kang, In-Yong; Ahn, Jinho; Oh, Hye-Keun; Chung, Yone-Chae

ArticleIssue Date2005CitationDigest of Papers - Microprocesses and Nanotechnology 2005: 2005 International Microprocesses and Nanotechnology Conference, v.2005, pp 84 - 85PublisherIEEE
SCIESCOPUS
ArF photoresist parameter optimization for mask error enhancement factor reductionGo to Link

Lee, Chang Ho; Oh, Hye-Keun

ArticleIssue Date2005CitationJapanese Journal of Applied Physics, v.44, no.10, pp 7404 - 7408PublisherIOP Publishing Ltd
SCOPUS
Best fidelity conditions for three party quantum teleportationGo to Link

Sim, Sangjin; Jin, Jeongwan; Kwon, Younghun

ArticleIssue Date2005CitationInternational Journal of Theoretical Physics, v.44, no.9, pp 1419 - 1427PublisherKluwer Academic/Plenum Publishers
SCIESCOPUSKCI
Line-Width Variation with Absorber Thickness in Extreme Ultraviolet LithographyGo to Link

JEON, Young-Doo; OH, HYE KEUN; AN, IL SIN; KIM, Jong-Sun

ArticleIssue Date2005CitationJournal of the Korean Physical Society, v.47, no.2, pp 223 - 227Publisher한국물리학회
SCIESCOPUS
Interference effects on electron collisions in strongly coupled semiclassical plasmasGo to Link

Song, Mi Young; Jung, Young Dae

ArticleIssue Date2005CitationPHYSICA SCRIPTA, v.72, no.2-3, pp.251 - 253PublisherIOP PUBLISHING LTD
SCIESCOPUS
Screened wannier exponent in weakly coupled plasmasGo to Link

Jung, Young Dae

ArticleIssue Date2005CitationPHYSICA SCRIPTA, v.72, no.2-3, pp.237 - 239PublisherROYAL SWEDISH ACAD SCIENCES
SCIESCOPUS
Landau damping effect on elastic collision in uniformly magnetized plasmasGo to Link

Kim., Chang Geun; Jung, Young Dae

ArticleIssue Date2005CitationPHYSICA SCRIPTA, v.72, no.2-3, pp 240 - 242PublisherIOP PUBLISHING LTD
SCIESCOPUS
Collective and screening effects on entanglement fidelity in elastic collisions in nonideal plasmasGo to Link

Chang, Dong-Man; Jung, Young Dae

ArticleIssue Date2005CitationPHYSICA SCRIPTA, v.72, no.2-3, pp.234 - 236PublisherIOP PUBLISHING LTD
SCOPUS
Numerical investigation of defect printability in extreme ultraviolet (EUV) reflector: Ru/Mo/Si multilayer systemGo to Link

Kang, In-Yong; Ahn, Jinho; Oh, Hye-Keun; Chung, Yong-Chae

ArticleIssue Date2005CitationJapanese Journal of Applied Physics, v.44, no.7B, pp 5724 - 5726PublisherIOP Publishing Ltd
SCIESCOPUSKCI
Lens aberration effect on the line width for different pattern shapes and duty ratiosGo to Link

Lee, Ji-Eun; Park, Seung-Wook; An, Ilsin; Oh, Hye-Keun; Lee, Chang-Ho

ArticleIssue Date2005CitationJournal of the Korean Physical Society, v.47, no.1, pp 47 - 53Publisher한국물리학회
SCIESCOPUS
Magnetic field effects on surface ion plasma wave in semi-bounded magnetized dusty plasmasGo to Link

Lee, Myoung Jae; Jung, Young Dae

ArticleIssue Date2005CitationZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, v.60, no.7, pp 503 - 506PublisherWALTER DE GRUYTER GMBH
SCOPUSKCI
Determination of the optical functions of various liquids by rotating compensator multichannel spectroscopic ellipsometryGo to Link

Kyung, Yoon Bang; Lee, Seunghyun; Oh, Hyekeun; An, Ilsin; Lee, Haiwon

ArticleIssue Date2005CitationBulletin of the Korean Chemical Society, v.26, no.6, pp 947 - 951Publisher대한화학회
SCIESCOPUSKCI
Calibration-free multichannel ellipsometry for retardance measurementGo to Link

An, Ilsin; Kyung, Jaisun; Bang, Kyoungyoon; Kim, Ok-Kyung; Oh, Hye-Keun; Collins, Robert Warren

ArticleIssue Date2005CitationJournal of the Korean Physical Society, v.46, pp S142 - S145Publisher한국물리학회
SCIESCOPUSKCI
Bulk effects of thermal flow resistsGo to Link

Kim, Sang-Kon; Oh, Hye-Keun; An, Ilsin; Lee, Sung-Muk; Bok, Cheol-Kyu; Moon, Seung-Chan

ArticleIssue Date2005CitationJournal of the Korean Physical Society, v.46, no.6, pp 1439 - 1444Publisher한국물리학회
SCIESCOPUS
Polarization charge effects on ion-dust grain collisions in presence of ion driftGo to Link

Lee, Myoung Jae; Jung, Young Dae

ArticleIssue Date2005CitationJOURNAL OF APPLIED PHYSICS, v.97, no.11, pp 1 - 4PublisherAMER INST PHYSICS
SCIESCOPUS
The evaluation of aberration effects according to pattern shape and duty ratioGo to Link

Lee, Ji-Eun; Park, Seung-Wook; Lee, Chang-Ho; Oh, Hyun-Wook; Bae, So-Yoon; Oh, Hye-Keun

ArticleIssue Date2005CitationProceedings of SPIE - The International Society for Optical Engineering, v.5754, no.PART 3, pp 1738 - 1749PublisherSPIE
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