ScholarWorks@Hanyang University ERICA Campus

2. Conference Papers(COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF APPLIED PHYSICS > 2. Conference Papers)833

Browse
rss_1.0 rss_2.0 atom_1.0

Subscribe to this collection to receive daily e-mail notification of new additions

Collection's Items (Sorted by Issue Date in Descending order): 621 to 640 of 833

193nm 화학 증폭형 감광제의 노광량에 따른 광학적 특성

오혜근

ConferenceIssue Date2002Citation한국 물리학회Publisher한국 물리학회Place부산
Profile formation for 157nm lithography simulation

오혜근

ConferenceIssue Date2002Citation한국 물리학회Publisher한국 물리학회Place부산
Apodized 매스크를 이용한 해상력 증가

오혜근

ConferenceIssue Date2002Citation한국 물리학회Publisher한국 물리학회Place부산
최소 선폭 구현을 위한 감광제 패턴의 붕괴 연구

오혜근

ConferenceIssue Date2002Citation한국 물리학회Publisher한국 물리학회Place부산
탈 초점효과의 수학적 분석과 공정에 미치는 영향 연구

오혜근

ConferenceIssue Date2002Citation한국 물리학회Publisher한국 물리학회Place부산
DNA에서의 코돈분포

권영헌

ConferenceIssue Date2002
Adibatic Quantum Computation and k-Sat Problem

권영헌

ConferenceIssue Date2002
CHMM에서의 화자적응을 위한 Maximum a Posteriori 개선에 관한 연구

권영헌

ConferenceIssue Date2002
DSP를 이용한 음성인식기

권영헌

ConferenceIssue Date2002
실시간 연속숫자음 인식기 성능향상을 위한 MAP적용

권영헌

ConferenceIssue Date2002
음성인식을 이용한 로봇제어

권영헌

ConferenceIssue Date2002
프로토콜을 이용한 화자인식시스템

권영헌

ConferenceIssue Date2002
Perturbed Quantum Search Hamiltonian

권영헌

ConferenceIssue Date2002
CD prediction by threshold energy resist model(TERM)

오혜근

ConferenceIssue Date2002CitationSPIE Microlithography symposium 2002PublisherSPIEPlace미국
resist develop prediction by monte carlo simulation

오혜근

ConferenceIssue Date2002CitationSPIE Microlithography symposium 2002PublisherSPIEPlace미국
Resist distribution effect of spin coating

오혜근

ConferenceIssue Date2002CitationSPIE Microlithography Symposium 2002PublisherSPIEPlace미국
Lithography process tuning by optical characterization

오혜근

ConferenceIssue Date2002CitationSemicon Korea Tech. SymposiumPublisherSemicon Korea Tech.
화학 증폭형 감광제의 벌크 이미지 형성

오혜근

ConferenceIssue Date2002Citation한국 반도체 학술대회Publisher한국 물리학회Place천안
200nm laser pattern generator, process study

오혜근

ConferenceIssue Date2002Citation한국 반도체 학술대회Publisher한국 물리학회Place천안
Variable threshold resist model using a new aerial image metric

오혜근

ConferenceIssue Date2002Citation한국 반도체 학술대회Publisher한국 물리학회Place천안
first 31 32 33 34 35 36 37 38 39 40 last

Discover

Type

CONTACT US

RSS_1.0 RSS_2.0 ATOM_1.0

55 Hanyangdeahak-ro, Sangnok-gu, Ansan, Gyeonggi-do, 15588, Korea+82-31-400-4269 sweetbrain@hanyang.ac.kr

COPYRIGHT © 2021 HANYANG UNIVERSITY. ALL RIGHTS RESERVED.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

한국어