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상위수준에서 테스트합성 기술의 개발
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주 | - |
| dc.date.accessioned | 2021-06-23T08:56:40Z | - |
| dc.date.available | 2021-06-23T08:56:40Z | - |
| dc.date.created | 2020-12-17 | - |
| dc.date.issued | 1998-04-01 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/35183 | - |
| dc.publisher | 한국정보과학회 | - |
| dc.title | 상위수준에서 테스트합성 기술의 개발 | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 박성주 | - |
| dc.identifier.bibliographicCitation | 한국정보과학회 봄 학술발표논문집 | - |
| dc.relation.isPartOf | 한국정보과학회 봄 학술발표논문집 | - |
| dc.citation.title | 한국정보과학회 봄 학술발표논문집 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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