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SSD 소프트에러 테스트의 국부적 방사선 조사를 위한 콜리메이터 장치

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dc.contributor.author백상현[백상현]-
dc.date.accessioned2021-06-23T09:01:10Z-
dc.date.available2021-06-23T09:01:10Z-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/35449-
dc.titleSSD 소프트에러 테스트의 국부적 방사선 조사를 위한 콜리메이터 장치-
dc.typePatent-
dc.contributor.affiliatedAuthor백상현[백상현]-
dc.type.rimsPAT-
dc.type.iprs특허-
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 4. Patents

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Baeg, Sanghyeon
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
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