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고속 메모리의 콤포넌트 테스트를 위한 DIMM Interface와 파워핀 제거 기능의 소켓 통합기능The combined system of power pin removable Socket and DIMM interface for high-speed memory component testing
- Alternative Title
- The combined system of power pin removable Socket and DIMM interface for high-speed memory component testing
- Authors
- 백상현[백상현]
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Collections - COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 4. Patents
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)