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Soft error issues with scaling technologies
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Baeg, Sanghyeon | - |
| dc.contributor.author | Bae, Jongsun | - |
| dc.contributor.author | Lee, Soonyoung | - |
| dc.contributor.author | Lim, Chul seung | - |
| dc.contributor.author | Jeon, Sang hoon | - |
| dc.contributor.author | Nam, Hyeonwoo | - |
| dc.date.accessioned | 2021-06-23T09:43:20Z | - |
| dc.date.available | 2021-06-23T09:43:20Z | - |
| dc.date.issued | 2012-11 | - |
| dc.identifier.issn | 1081-7735 | - |
| dc.identifier.issn | 2377-5386 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/36171 | - |
| dc.description.abstract | As transistor geometry shrinks, the erroneous and spurious charge from a particle strike tends to be shared by multiple nodes and causes multiple nodes upset. Such SEU mechanism invalidates the hardening principle of protecting a single node in relatively larger technologies. SEU needs to be accordingly understood and evaluated. In an 28-nm design example, SEU can happen in 6-day interval if no mitigation technique is used. © 2012 IEEE. | - |
| dc.format.extent | 1 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | IEEE | - |
| dc.title | Soft error issues with scaling technologies | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/ATS.2012.72 | - |
| dc.identifier.scopusid | 2-s2.0-84872518643 | - |
| dc.identifier.bibliographicCitation | Proceedings of the Asian Test Symposium, pp 68 - 68 | - |
| dc.citation.title | Proceedings of the Asian Test Symposium | - |
| dc.citation.startPage | 68 | - |
| dc.citation.endPage | 68 | - |
| dc.type.docType | Conference Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordPlus | Mitigation techniques | - |
| dc.subject.keywordPlus | Multiple cell upset | - |
| dc.subject.keywordPlus | Multiple nodes | - |
| dc.subject.keywordPlus | Scaling technology | - |
| dc.subject.keywordPlus | Single event upsets | - |
| dc.subject.keywordPlus | Soft error | - |
| dc.subject.keywordPlus | Testing | - |
| dc.subject.keywordAuthor | Multiple cell upset (MCU) | - |
| dc.subject.keywordAuthor | Single-event upset (SEU) | - |
| dc.subject.keywordAuthor | Soft error | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/6394175 | - |
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Related Researcher
- Baeg, Sanghyeon
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)