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FPGA placement by using combined analytical and simulated annealing methods

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dc.contributor.authorLim, Iksoon-
dc.contributor.authorYeo, Donghoon-
dc.contributor.authorYu, Wang-
dc.contributor.authorShin, Hyunchul-
dc.date.accessioned2021-06-23T10:01:53Z-
dc.date.available2021-06-23T10:01:53Z-
dc.date.issued2012-12-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/36261-
dc.description.abstractNowadays, placement problems become more complex since they need to consider standard cells, mixed size blocks, and area constraints. Analytical placement and simulated annealing placement methods are widely used recently owing to their good performance. But two placement methods have different placement features and characteristics during placement. In this paper, we analyze two different placement algorithms and apply them for FPGA placement capitalizing their advantages. By applying our placement method we could reduce wirelength cost by 9% on the average for a set of benchmark circuits when compared with a well-known commercial placement tool. © 2012 AICIT.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-
dc.titleFPGA placement by using combined analytical and simulated annealing methods-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.scopusid2-s2.0-84881142727-
dc.identifier.wosid000324412800260-
dc.identifier.bibliographicCitation2012 7th International Conference on Computing and Convergence Technology (ICCCT), pp 1339 - 1342-
dc.citation.title2012 7th International Conference on Computing and Convergence Technology (ICCCT)-
dc.citation.startPage1339-
dc.citation.endPage1342-
dc.type.docTypeConference Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryComputer Science, Theory & Methods-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusAnalytical Placement-
dc.subject.keywordPlusBenchmark circuit-
dc.subject.keywordPlusCombined method-
dc.subject.keywordPlusplacement-
dc.subject.keywordPlusPlacement algorithm-
dc.subject.keywordPlusPlacement methods-
dc.subject.keywordPlusPlacement problems-
dc.subject.keywordPlusSimulated annealing method-
dc.subject.keywordPlusComputer science-
dc.subject.keywordPlusField programmable gate arrays (FPGA)-
dc.subject.keywordPlusSimulated annealing-
dc.subject.keywordAuthorcombined method-
dc.subject.keywordAuthorFPGA-
dc.subject.keywordAuthorplacement-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/6530548?arnumber=6530548&SID=EBSCO:edseee-
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

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