Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
TAM 기반의 병렬 코어 스캔 테스트를 위한 설계 기술
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주[박성주] | - |
| dc.date.accessioned | 2021-06-23T10:51:51Z | - |
| dc.date.available | 2021-06-23T10:51:51Z | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/38028 | - |
| dc.title | TAM 기반의 병렬 코어 스캔 테스트를 위한 설계 기술 | - |
| dc.title.alternative | Design technique for concurrent core testing based on Test Access Mechanism(TAM) | - |
| dc.type | Patent | - |
| dc.contributor.affiliatedAuthor | 박성주[박성주] | - |
| dc.type.rims | PAT | - |
| dc.type.iprs | 특허 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 4. Patents
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.