Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
시스템 온 칩 테스트 장치
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주[박성주] | - |
| dc.date.accessioned | 2021-06-23T10:51:54Z | - |
| dc.date.available | 2021-06-23T10:51:54Z | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/38033 | - |
| dc.title | 시스템 온 칩 테스트 장치 | - |
| dc.type | Patent | - |
| dc.contributor.affiliatedAuthor | 박성주[박성주] | - |
| dc.type.rims | PAT | - |
| dc.type.iprs | 특허 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 4. Patents
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.