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아이피 코아들로 구성된 시스템 온 칩 테스트를 위한 개선된 탭연결 모듈장치
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박성주[박성주] | - |
| dc.date.accessioned | 2021-06-23T10:51:58Z | - |
| dc.date.available | 2021-06-23T10:51:58Z | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/38039 | - |
| dc.title | 아이피 코아들로 구성된 시스템 온 칩 테스트를 위한 개선된 탭연결 모듈장치 | - |
| dc.type | Patent | - |
| dc.contributor.affiliatedAuthor | 박성주[박성주] | - |
| dc.type.rims | PAT | - |
| dc.type.iprs | 특허 | - |
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Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 4. Patents
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