Transmission electron microscopy analysis of octanethiol-coated Cu powders
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Tae Hun | - |
dc.contributor.author | Yoo, Jung Ho | - |
dc.contributor.author | Hyun, Moon Seop | - |
dc.contributor.author | Yang, Jun-Mo | - |
dc.contributor.author | Kwon, Jinhyeong | - |
dc.contributor.author | Lee, Caroline Sunyong | - |
dc.contributor.author | Park, Jucheol | - |
dc.contributor.author | Baik, Kyeong Ho | - |
dc.date.accessioned | 2021-06-23T11:03:39Z | - |
dc.date.available | 2021-06-23T11:03:39Z | - |
dc.date.issued | 2011-04 | - |
dc.identifier.issn | 0022-0744 | - |
dc.identifier.issn | 1477-9986 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/38170 | - |
dc.description.abstract | In this study, microstructures of Cu powders coated with octanethiol were analyzed using (scanning) transmission electron microscopy. Moreover, aging process of the octanethiol-coated layer as time passes by was analyzed using the electron energy loss spectroscopy technique. The octanethiol layer coated on the surface of Cu powders was kept until it was exposed to air for around 30 days. As days passes by, the coating layer had been decomposed and then a Cu(2)O layer was formed on the surface of powders. | - |
dc.format.extent | 6 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | OXFORD UNIV PRESS | - |
dc.title | Transmission electron microscopy analysis of octanethiol-coated Cu powders | - |
dc.type | Article | - |
dc.publisher.location | 영국 | - |
dc.identifier.doi | 10.1093/jmicro/dfr007 | - |
dc.identifier.scopusid | 2-s2.0-79955004761 | - |
dc.identifier.wosid | 000289625800005 | - |
dc.identifier.bibliographicCitation | JOURNAL OF ELECTRON MICROSCOPY, v.60, no.2, pp 143 - 148 | - |
dc.citation.title | JOURNAL OF ELECTRON MICROSCOPY | - |
dc.citation.volume | 60 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 143 | - |
dc.citation.endPage | 148 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Microscopy | - |
dc.relation.journalWebOfScienceCategory | Microscopy | - |
dc.subject.keywordPlus | SELF-ASSEMBLED MONOLAYERS | - |
dc.subject.keywordPlus | VAPOR-DEPOSITION | - |
dc.subject.keywordPlus | COPPER | - |
dc.subject.keywordPlus | NANOPARTICLES | - |
dc.subject.keywordPlus | PROTECTION | - |
dc.subject.keywordPlus | SURFACES | - |
dc.subject.keywordAuthor | Cu powder | - |
dc.subject.keywordAuthor | octanethiol | - |
dc.subject.keywordAuthor | field-emission transmission electron microscope | - |
dc.subject.keywordAuthor | high-resolution transmission electron microscopy | - |
dc.subject.keywordAuthor | electron energy loss spectroscopy | - |
dc.identifier.url | https://academic.oup.com/jmicro/article/60/2/143/1988975 | - |
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