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비균질한 적외선 환경에서 PCA(Principal Component Analysis)평면을 이용한 객체영역 추출 방법
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 문영식[문영식] | - |
| dc.date.accessioned | 2021-06-23T11:11:25Z | - |
| dc.date.available | 2021-06-23T11:11:25Z | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/38531 | - |
| dc.title | 비균질한 적외선 환경에서 PCA(Principal Component Analysis)평면을 이용한 객체영역 추출 방법 | - |
| dc.title.alternative | 비균질한 적외선 환경에서 TLS 에러를 이용하기 위한 PCA(Principal Component Analysis)평면을 이용한 객체영역 추출 방법 | - |
| dc.type | Patent | - |
| dc.contributor.affiliatedAuthor | 문영식[문영식] | - |
| dc.type.rims | PAT | - |
| dc.type.iprs | 특허 | - |
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