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증강현실에서 가려진 마커를 위한 Affine-SIFT 정합 점들을 이용한 마커 검출 시스템 및 방법
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 문영식[문영식] | - |
| dc.date.accessioned | 2021-06-23T11:11:31Z | - |
| dc.date.available | 2021-06-23T11:11:31Z | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/38541 | - |
| dc.title | 증강현실에서 가려진 마커를 위한 Affine-SIFT 정합 점들을 이용한 마커 검출 시스템 및 방법 | - |
| dc.title.alternative | Marker detection by using Affine-SIFT matching points for marker occlusion of augmented reality | - |
| dc.type | Patent | - |
| dc.contributor.affiliatedAuthor | 문영식[문영식] | - |
| dc.type.rims | PAT | - |
| dc.type.iprs | 특허 | - |
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Collections - COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 4. Patents
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