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Multichannel ellipsometry for monitoring processes

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dc.contributor.authorAn, Ilsin-
dc.date.accessioned2021-06-23T13:37:42Z-
dc.date.available2021-06-23T13:37:42Z-
dc.date.issued2010-03-
dc.identifier.issn1934-2608-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/39932-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherSociety of Photo-Optical Instrumentation Engineers-
dc.titleMultichannel ellipsometry for monitoring processes-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1117/1.3374056-
dc.identifier.scopusid2-s2.0-80455149820-
dc.identifier.wosid000278049300001-
dc.identifier.bibliographicCitationJournal of Nanophotonics, v.4, pp 1 - 5-
dc.citation.titleJournal of Nanophotonics-
dc.citation.volume4-
dc.citation.startPage1-
dc.citation.endPage5-
dc.type.docTypeEditorial Material-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaOptics-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryOptics-
dc.subject.keywordPlusSPECTROSCOPIC ELLIPSOMETRY-
dc.subject.keywordPlusTHIN-FILM-
dc.identifier.urlhttps://www.spiedigitallibrary.org/journals/journal-of-nanophotonics/volume-4/issue-01/040302/Commentary-Multichannel-ellipsometry-for-monitoring-processes/10.1117/1.3374056.full?SSO=1-
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF PHOTONICS AND NANOELECTRONICS > 1. Journal Articles

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