Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Effective Techniques for Low Cost Post-Silicon Repair and Revision
- Authors
- 신현철
- Issue Date
- 1-Jul-2009
- Publisher
- IEEE
- Citation
- IEEE International Workshop on Design for Manufacturability & Yeild, pp.102 - 104
- Journal Title
- IEEE International Workshop on Design for Manufacturability & Yeild
- Start Page
- 102
- End Page
- 104
- Files in This Item
- There are no files associated with this item.
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.