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DFD를 위한 효율적인 콤플렉스 셀 설계

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dc.contributor.author신현철-
dc.date.accessioned2021-06-23T17:02:36Z-
dc.date.available2021-06-23T17:02:36Z-
dc.date.created2021-02-18-
dc.date.issued2008-11-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/42040-
dc.description.abstractIn this paper, we propose complex gate type structures, for design for debug and repair. When an error is found on a semiconductor chip, we want to fix the error by using the spare cells. Our complex gates based spare cells use 55% less NMOSs and PMOSs on the average, when compared to standard cell NAND gate structures, for ISCAS85 benchmark circuits.-
dc.publisher대한전자공학회-
dc.titleDFD를 위한 효율적인 콤플렉스 셀 설계-
dc.title.alternativeEfficient Complex Cell Design for Design for Debug-
dc.typeArticle-
dc.contributor.affiliatedAuthor신현철-
dc.identifier.bibliographicCitation2008 SoC 추계학술대회-
dc.relation.isPartOf2008 SoC 추계학술대회-
dc.citation.title2008 SoC 추계학술대회-
dc.type.rimsART-
dc.description.journalClass3-
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COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

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