Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Machine Vision System for Automatic Inspection of Bridges

Full metadata record
DC Field Value Language
dc.contributor.authorLee, Jeong ho-
dc.contributor.authorLee, Jong min-
dc.contributor.authorKim, Hyung jin-
dc.contributor.authorMoon, Young Shik-
dc.date.accessioned2021-06-23T17:40:14Z-
dc.date.available2021-06-23T17:40:14Z-
dc.date.created2021-02-18-
dc.date.issued2008-05-
dc.identifier.urihttps://scholarworks.bwise.kr/erica/handle/2021.sw.erica/42487-
dc.description.abstractIn the bridge inspection, the information of cracks is important to maintain a bridge. Therefore, automatic crack detection is highly desirable for efficiency and objectivity of crack assessment. However, in general, it is very difficult to detect cracks automatically from noisy concrete surfaces. In this paper, we propose a machine vision system for automatic inspection of bridges. The proposed machine vision system can detect cracks in real time, and it has some utility functions for supervised manipulation. The performance of the proposed system has been evaluated with 100 noisy images. In terms of accuracy in detecting cracks, experimental results show that the proposed method is superior to the conventional methods for detecting cracks.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-
dc.titleMachine Vision System for Automatic Inspection of Bridges-
dc.typeArticle-
dc.contributor.affiliatedAuthorMoon, Young Shik-
dc.identifier.doi10.1109/CISP.2008.672-
dc.identifier.scopusid2-s2.0-52149089878-
dc.identifier.bibliographicCitationThe 2008 International Congress on Image and Signal Processing, pp.363 - 366-
dc.relation.isPartOfThe 2008 International Congress on Image and Signal Processing-
dc.citation.titleThe 2008 International Congress on Image and Signal Processing-
dc.citation.startPage363-
dc.citation.endPage366-
dc.type.rimsART-
dc.description.journalClass3-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassother-
dc.subject.keywordAuthorMachine Vision-
dc.subject.keywordAuthorAutomatic Inspection-
dc.subject.keywordAuthorCrack Detection-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/4566507-
Files in This Item
Go to Link
Appears in
Collections
COLLEGE OF COMPUTING > SCHOOL OF COMPUTER SCIENCE > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE