Low-cost scan test for IEEE-1500-Based SoC
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yi, Hyunbean | - |
dc.contributor.author | Song, Jaehoon | - |
dc.contributor.author | Park, Sungju | - |
dc.date.accessioned | 2021-06-23T17:40:49Z | - |
dc.date.available | 2021-06-23T17:40:49Z | - |
dc.date.created | 2021-01-21 | - |
dc.date.issued | 2008-05 | - |
dc.identifier.issn | 0018-9456 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/42525 | - |
dc.description.abstract | In this paper, a reduced-pin-count-testing technique is presented to control the IEEE-1500 wrapper through the IEEE-1149.1 TAP for scan delay test. By using only the IEEE1149.1 TAP control pins as test-access pins and by embedding an on-chip test clock generator, low-cost automated test equipment (ATE) can be efficiently utilized to reduce testing costs. Experiments show the effectiveness of our technique in utilizing the ATE channels and scan delay testing. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Low-cost scan test for IEEE-1500-Based SoC | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Sungju | - |
dc.identifier.doi | 10.1109/TIM.2007.911699 | - |
dc.identifier.scopusid | 2-s2.0-42549159834 | - |
dc.identifier.wosid | 000257541500024 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, v.57, no.5, pp.1071 - 1078 | - |
dc.relation.isPartOf | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | - |
dc.citation.title | IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | - |
dc.citation.volume | 57 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 1071 | - |
dc.citation.endPage | 1078 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.subject.keywordAuthor | delay test | - |
dc.subject.keywordAuthor | design-for-testability (DtT) | - |
dc.subject.keywordAuthor | IEEE 1500 | - |
dc.subject.keywordAuthor | reduced pin-count test (RPCT) | - |
dc.subject.keywordAuthor | system-on-a-chip (SoC) | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/4432930 | - |
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