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Dynamics of Positive Charge Trapping in a-IGZO TFTs under NBIS Using Microsecond PulsedLight Illumination
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 오새룬터 | - |
| dc.date.accessioned | 2021-06-22T10:45:55Z | - |
| dc.date.available | 2021-06-22T10:45:55Z | - |
| dc.date.issued | 20190828 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/4406 | - |
| dc.title | Dynamics of Positive Charge Trapping in a-IGZO TFTs under NBIS Using Microsecond PulsedLight Illumination | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | International Meeting on Information Display (IMID) | - |
| dc.citation.conferencePlace | 경주 HICO | - |
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Related Researcher
- OH, SAE ROON TER
- ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)