Hybrid test data compression technique for low-power scan test data
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Song, Jaehoon | - |
dc.contributor.author | Lee, Junseop | - |
dc.contributor.author | Kim, Byeongjin | - |
dc.contributor.author | Jung, Taejin | - |
dc.contributor.author | Yi, Hyunbean | - |
dc.contributor.author | Park, Sungju | - |
dc.date.accessioned | 2021-06-23T20:44:10Z | - |
dc.date.available | 2021-06-23T20:44:10Z | - |
dc.date.issued | 2007-11 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/44369 | - |
dc.description.abstract | The large test data volume and power consumption are major problems in testing System-on-a-Chip (SoC) which is a key component of today's embedded system. To reduce the test application time from an Automatic Test Equipment (ATE), a new test data compression technique is proposed in this paper. Don 't-cares in a pre-computed test cube set are assigned to reduce the test power consumption. Then, fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or technique. Finally, test set converted is compressed to reduce test application time. © 2007 IEEE. | - |
dc.format.extent | 5 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | IEEE | - |
dc.title | Hybrid test data compression technique for low-power scan test data | - |
dc.type | Article | - |
dc.publisher.location | 미국 | - |
dc.identifier.doi | 10.1109/ISITC.2007.11 | - |
dc.identifier.scopusid | 2-s2.0-48149087423 | - |
dc.identifier.wosid | 000252960000030 | - |
dc.identifier.bibliographicCitation | Proceedings - 2007 International Symposium on Information Technology Convergence, ISITC 2007, pp 152 - 156 | - |
dc.citation.title | Proceedings - 2007 International Symposium on Information Technology Convergence, ISITC 2007 | - |
dc.citation.startPage | 152 | - |
dc.citation.endPage | 156 | - |
dc.type.docType | Conference Paper | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | Automatic test equipments | - |
dc.subject.keywordPlus | Compression efficiencies | - |
dc.subject.keywordPlus | Hybrid tests | - |
dc.subject.keywordPlus | Key components | - |
dc.subject.keywordPlus | Low powers | - |
dc.subject.keywordPlus | Power consumptions | - |
dc.subject.keywordPlus | Scan test datums | - |
dc.subject.keywordPlus | Test application times | - |
dc.subject.keywordPlus | Test data compressions | - |
dc.subject.keywordPlus | Test datums | - |
dc.subject.keywordPlus | Test powers | - |
dc.subject.keywordPlus | Test sets | - |
dc.subject.keywordPlus | Application specific integrated circuits | - |
dc.subject.keywordPlus | Automatic testing | - |
dc.subject.keywordPlus | Electric power utilization | - |
dc.subject.keywordPlus | Image compression | - |
dc.subject.keywordPlus | Information technology | - |
dc.subject.keywordPlus | Integrated circuits | - |
dc.subject.keywordPlus | Test facilities | - |
dc.subject.keywordPlus | Testing | - |
dc.subject.keywordPlus | Data compression | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/4410624?arnumber=4410624&SID=EBSCO:edseee | - |
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