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Assessing the effect of stylus tip radius on surface roughness measurement by accumulation spectral analysis
- Issue Date
- Jan-2006
- Publisher
- 한국정밀공학회
- Keywords
- Measurement; Surface roughness; Stylus profiler; Spectral analysis
- Citation
- International Journal of Precision Engineering and Manufacturing, v.7, no.1, pp.9 - 12
- Indexed
- KCI
- Volume
- 7
- Number
- 1
- Start Page
- 9
- End Page
- 12
- ISSN
- 2234-7593
- Files in This Item
- Go to Link
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Related Researcher
- CHO, NAHM GYOO
- ERICA 공학대학 (DEPARTMENT OF MECHANICAL ENGINEERING)