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Analysis of Langmuir probe data using wavelet transform

Authors
Park, Bong-KyoungKim, Dai-GyoungKim, Gon-Ho
Issue Date
Apr-2004
Publisher
Institute of Electrical and Electronics Engineers
Keywords
Langnmir probe (LP); plasma diagnostics; wavelet transform
Citation
IEEE Transactions on Plasma Science, v.32, no.2, pp 355 - 361
Pages
7
Indexed
SCIE
SCOPUS
Journal Title
IEEE Transactions on Plasma Science
Volume
32
Number
2
Start Page
355
End Page
361
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/46607
DOI
10.1109/TPS.2004.828123
ISSN
0093-3813
1939-9375
Abstract
A new algorithm to analyze Langmuir probe (LP) data has been developed with Daubechies; (DWT) and bi-orthogonal wavelet transforms (BWT), which remove the noise from the raw data without losing important information. The first derivative of the LP signal is processed using BWT and its result readily provides the peak value, which corresponds to the plasma potential. The LP data processed using DWT provides the saturation current lines directly which corresponds to the electron and ion saturation currents. The region required to obtain the electron temperature can be automatically determined from the plasma potential to the end of the ion saturation current line so that the input from the analyzer is not required to continue the analysis. The plasma density can be obtained from the electron saturation current and the electron temperature. Accuracy tests of the algorithm are carried out with simulation probe data containing various levels of random noise. The results show that the algorithm based on the wavelet transforms removes noise effectively and that the plasma parameters are obtained accurately.
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Kim, Dai-Gyoung
ERICA 소프트웨어융합대학 (ERICA 수리데이터사이언스학과)
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